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dc.contributor.authorGuler, T
dc.contributor.authorHicyilmaz, C
dc.contributor.authorGokagac, G
dc.contributor.authorEkmekci, Z
dc.date.accessioned2019-07-27T12:10:23Z
dc.date.accessioned2019-07-28T10:22:31Z
dc.date.available2019-07-27T12:10:23Z
dc.date.available2019-07-28T10:22:31Z
dc.date.issued2004
dc.identifier.issn0021-9797
dc.identifier.issn1095-7103
dc.identifier.urihttps://dx.doi.org/10.1016/j.jcis.2004.06.036
dc.identifier.urihttps://hdl.handle.net/20.500.12418/11143
dc.descriptionWOS: 000224708300004en_US
dc.descriptionPubMed ID: 15380410en_US
dc.description.abstractThe mechanism of dithiophosphinate (DTPI) adsorption on chalcopyrite was investigated by diffuse reflectance Fourier transformation (DRIFT) spectroscopy and by cyclic voltammetry (CV) at various pHs. CV experiments showed that the redox reactions occurred at a certain degree of irreversibility on the chalcopyrite surface in the absence of a collector due to preferential dissolution of iron ions in slightly acid solution and irreversible surface coverage by iron oxyhydroxides in neutral and alkaline solutions. In the presence of DTPI, CV experiments failed to identify the type of the adsorbed DTPI species and electrochemical processes occurring on chalcopyrite due to formation of an electrochemically passive surface layer preventing electron transfer. However, DRIFT spectroscopy tests showed this passive layer to be mainly CuDTPI + (DTPI)(2). Both CV and DRIFT spectroscopy established that the activity of collector species decreased with increasing pH due to formation of stable hydrophilic metal oxyhydroxides on the chalcopyrite surface. (C) 2004 Elsevier Inc. All rights reserved.en_US
dc.language.isoengen_US
dc.publisherACADEMIC PRESS INC ELSEVIER SCIENCEen_US
dc.relation.isversionof10.1016/j.jcis.2004.06.036en_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectchalcopyriteen_US
dc.subjectdithiophosphinateen_US
dc.subjectelectrochemistryen_US
dc.subjectcyclic voltammetryen_US
dc.subjectDRIFT spectroscopyen_US
dc.titleVoltammetric and drift spectroscopy investigation in dithiophosphinate-chalcopyrite systemen_US
dc.typearticleen_US
dc.relation.journalJOURNAL OF COLLOID AND INTERFACE SCIENCEen_US
dc.contributor.departmentCumhuriyet Univ, Dept Mat & Met Engn, TR-58140 Sivas, Turkey -- Middle E Tech Univ, Dept Mineral Engn, TR-06531 Ankara, Turkey -- Middle E Tech Univ, Dept Chem, TR-06531 Ankara, Turkey -- Univ Hacettepe, Min Engn Dept, TR-06100 Ankara, Turkeyen_US
dc.contributor.authorIDGuler, Taki -- 0000-0001-9688-6894en_US
dc.identifier.volume279en_US
dc.identifier.issue1en_US
dc.identifier.endpage54en_US
dc.identifier.startpage46en_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US


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