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dc.contributor.authorOzturk, E
dc.contributor.authorSokmen, I
dc.date.accessioned2019-07-27T12:10:23Z
dc.date.accessioned2019-07-28T10:23:07Z
dc.date.available2019-07-27T12:10:23Z
dc.date.available2019-07-28T10:23:07Z
dc.date.issued2004
dc.identifier.issn0749-6036
dc.identifier.urihttps://dx.doi.org/10.1016/j.spmi.2004.02.020
dc.identifier.urihttps://hdl.handle.net/20.500.12418/11300
dc.descriptionWOS: 000223511800011en_US
dc.description.abstractFor different applied electric fields the intersubband transitions of double Si delta-doped GaAs structures are theoretically investigated for a uniform donor distribution. The electronic structure has been calculated by solving the Schrodinger and Poisson equations self-consistently. It is found that the changes of the confining potential, the subband energies and intersubband optical absorption are quite sensitive to the applied electric field. Different from the single delta-doped structure, we have seen the abrupt changing of the subband energies and the absorption coefficient whenever the applied electric field reaches two certain values. While for the (1-2) intersubband transition, the intersubband absorption spectrum shows blueshifts up to the first critical electric field value, this spectrum shows redshifts up to the second critical electric field value and shows blueshifts for higher electric fields than the second critical field values. This behavior in the intersubband transitions for different electric fields can be used in some infrared optical device applications based on the intersubband transitions of electrons. (C) 2004 Elsevier Ltd. All rights reserved.en_US
dc.language.isoengen_US
dc.publisherACADEMIC PRESS LTD ELSEVIER SCIENCE LTDen_US
dc.relation.isversionof10.1016/j.spmi.2004.02.020en_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectdouble delta-doped GaAsen_US
dc.subjectself-consistentlyen_US
dc.subjectthe intersubband absorption coefficient and the applied electric fielden_US
dc.titleIntersubband optical absorption of double Si delta-doped GaAs layersen_US
dc.typearticleen_US
dc.relation.journalSUPERLATTICES AND MICROSTRUCTURESen_US
dc.contributor.departmentCumhuriyet Univ, Dept Phys, TR-58140 Sivas, Turkey -- Dokuz Eylul Univ, Dept Phys, Izmir, Turkeyen_US
dc.contributor.authorIDOZTURK, EMINE -- 0000-0003-2508-0863en_US
dc.identifier.volume35en_US
dc.identifier.issue01.Feben_US
dc.identifier.endpage104en_US
dc.identifier.startpage95en_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US


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