Browsing Makale Koleksiyonu by Publisher "NATL INST OPTOELECTRONICS"
Now showing items 1-1 of 1
-
Modeling of reflectance properties of ZnO film using artificial neural networks
(NATL INST OPTOELECTRONICS, 2015)A ZnO thin film was prepared on a p-Si (100) substrate by using a pulsed filtered cathodic vacuum arc deposition system (PFCVAD). Specular reflectance, a nondestructive technique, can be used to measure thickness, refractive ...