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Modeling of reflectance properties of ZnO film using artificial neural networks
(NATL INST OPTOELECTRONICS, 2015)
A ZnO thin film was prepared on a p-Si (100) substrate by using a pulsed filtered cathodic vacuum arc deposition system (PFCVAD). Specular reflectance, a nondestructive technique, can be used to measure thickness, refractive ...