dc.contributor.author | Okatan M. | |
dc.date.accessioned | 2019-07-27T12:10:23Z | |
dc.date.accessioned | 2019-07-28T09:33:09Z | |
dc.date.available | 2019-07-27T12:10:23Z | |
dc.date.available | 2019-07-28T09:33:09Z | |
dc.date.issued | 2018 | |
dc.identifier.isbn | 9781538615010 | |
dc.identifier.uri | https://dx.doi.org/10.1109/SIU.2018.8404155 | |
dc.identifier.uri | https://hdl.handle.net/20.500.12418/5697 | |
dc.description | Aselsan;et al.;Huawei;IEEE Signal Processing Society;IEEE Turkey Section;Netas | en_US |
dc.description | 26th IEEE Signal Processing and Communications Applications Conference, SIU 2018 -- 2 May 2018 through 5 May 2018 -- | en_US |
dc.description.abstract | D-dimensional amplitude trimmed estimator (DATE) is used for estimating the noise standard deviation in data that can be modelled as a signal in additive white Gaussian noise. Truncation thresholds are a pair of amplitude thresholds that are used for spike detection in extracellular neural recordings. Noise standard deviation is estimated as a byproduct of the computation of the truncation thresholds. Here, standard deviation estimates obtained using DATE and truncation thresholds are compared in realistic simulations of extracellular neural recordings. The results show that noise standard deviation is estimated more accurately and faster with truncation thresholds. These findings are important for developing a suitable method for amplitude thresholding in brain-machine-interfaces. © 2018 IEEE. | en_US |
dc.language.iso | tur | en_US |
dc.publisher | Institute of Electrical and Electronics Engineers Inc. | en_US |
dc.relation.isversionof | 10.1109/SIU.2018.8404155 | en_US |
dc.rights | info:eu-repo/semantics/closedAccess | en_US |
dc.subject | Computational neuroscience | en_US |
dc.subject | Extracellular neural recording | en_US |
dc.subject | Scale estimation | en_US |
dc.subject | Signal detection | en_US |
dc.title | A comparative study on the estimation of noise standard deviation using DATE and truncation thresholds [Gürültü Standart Sapmasinin DATE ve Kirpma Esikleri ile Kestirimi Üzerine Karsilastirmali bir Çalisma] | en_US |
dc.type | conferenceObject | en_US |
dc.relation.journal | 26th IEEE Signal Processing and Communications Applications Conference, SIU 2018 | en_US |
dc.contributor.department | Okatan, M., Elektrik Ve Enerji Bolumu, Cumhuriyet Universitesi, Sivas Meslek Yuksekokulu, Sivas, Turkey | en_US |
dc.identifier.endpage | 4 | en_US |
dc.identifier.startpage | 1 | en_US |
dc.relation.publicationcategory | Konferans Öğesi - Uluslararası - Kurum Öğretim Elemanı | en_US |