dc.contributor.author | Tuzemen, E. Senadim | |
dc.contributor.author | Kara, K. | |
dc.contributor.author | Takci, D. K. | |
dc.contributor.author | Esen, R. | |
dc.date.accessioned | 2019-07-27T12:10:23Z | |
dc.date.accessioned | 2019-07-28T09:56:14Z | |
dc.date.available | 2019-07-27T12:10:23Z | |
dc.date.available | 2019-07-28T09:56:14Z | |
dc.date.issued | 2015 | |
dc.identifier.issn | 0973-1458 | |
dc.identifier.issn | 0974-9845 | |
dc.identifier.uri | https://dx.doi.org/10.1007/s12648-014-0569-4 | |
dc.identifier.uri | https://hdl.handle.net/20.500.12418/7908 | |
dc.description | WOS: 000351564800005 | en_US |
dc.description.abstract | N-doped ZnO and N-Al codoped ZnO films are deposited onto glass substrate at room temperature by pulsed filtered cathodic vacuum arc deposition system. The films are characterized by X-ray diffraction, Raman spectra, UV-Vis-NIR spectrophotometer, atomic force microscopy (AFM) and Hall measurements. Films are textured along the (002) direction. AFM images reveal that surface of N-Al codoped ZnO film grown at RT is smoother than that of the N-doped ZnO (ZnO:N) film. Optical band gap of the N-Al codoped ZnO film is higher than that of N-doped ZnO (ZnO: N) film. When N-Al codoped ZnO film is compared to N-doped ZnO film, it is revealed that N-Al codoped ZnO film has a lower hole mobility of 18 cm(2)/V s, a higher hole concentration of 1.205 x 10(19) cm(-3) and thus a lower electrical resistivity of 2.730 x 10(-2) ohm cm. | en_US |
dc.language.iso | eng | en_US |
dc.publisher | INDIAN ASSOC CULTIVATION SCIENCE | en_US |
dc.relation.isversionof | 10.1007/s12648-014-0569-4 | en_US |
dc.rights | info:eu-repo/semantics/closedAccess | en_US |
dc.subject | Absorption coefficient | en_US |
dc.subject | ZnO | en_US |
dc.subject | Hall effect | en_US |
dc.subject | Raman spectra | en_US |
dc.title | Comparison of N-doped ZnO and N-Al codoped ZnO thin films deposited by pulsed filtered cathodic vacuum arc deposition | en_US |
dc.type | article | en_US |
dc.relation.journal | INDIAN JOURNAL OF PHYSICS | en_US |
dc.contributor.department | [Tuzemen, E. Senadim] Cumhuriyet Univ, Dept Phys, Nanotechnol Ctr, TR-58140 Sivas, Turkey -- [Kara, K.] Istanbul Univ, Dept Phys, TR-34314 Istanbul, Turkey -- [Takci, D. K. -- Esen, R.] Cukurova Univ, Dept Phys, TR-01330 Adana, Turkey | en_US |
dc.contributor.authorID | kara, kamuran -- 0000-0002-9598-8108; TAKCI, DENIZ KADIR -- 0000-0002-9841-242X; Kara, Kamuran -- 0000-0002-9598-8108 | en_US |
dc.identifier.volume | 89 | en_US |
dc.identifier.issue | 4 | en_US |
dc.identifier.endpage | 345 | en_US |
dc.identifier.startpage | 337 | en_US |
dc.relation.publicationcategory | Makale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı | en_US |