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dc.contributor.authorHopoğlu,Hicret
dc.contributor.authorAydınoğlu, Hafize Seda
dc.contributor.authorÖzer, Ali
dc.contributor.authorŞenadım Tüzemen, Ebru
dc.date.accessioned2022-05-11T15:08:50Z
dc.date.available2022-05-11T15:08:50Z
dc.date.issued2021tr
dc.identifier.citationaTeknoloji Fakültesi, Optik Mühendisliği Bölümü, Sivas Cumhuriyet Üniversitesi, 58140, Sivas, Türkiye bTıbbi Hizmetler ve Teknikler Anabilim Dalı, Gözlükçülük Programı, Sağlık Meslek Yüksekokulu, Sivas Cumhuriyet Üniversitesi, 58140, Sivas, Türkiye cMetalurji ve Malzeme Mühendisliği Bölümü, Sivas Cumhuriyet Üniversitesi, 58140, Sivas, Türkiye dİleri Teknoloji Ar-Ge Merkezi, Sivas Cumhuriyet Üniversitesi, 58140, Sivas, Türkiye eNanofotonik Araştırma ve Uygulama Merkezi, Sivas Cumhuriyet Üniversitesi, 58140, Sivas, Türkiye fFizik Bölümü, Fen Fakültesi, Sivas Cumhuriyet Üniversitesi, 58140, Sivas, Türkiyetr
dc.identifier.urihttps://hdl.handle.net/20.500.12418/12845
dc.description.abstractUn-doped and nitrogen-doped ZnO thin films were grown by using radio frequency (RF) magnetron sputtering method changing the nitrogen flow rate between 0% ����� 12.5% and the thickness dependence of films was determined. The effect of nitrogen doping concentration on the structural, morphological, and optical properties of zinc oxide thin films was studied. X-ray diffraction (XRD) analysis confirmed that the nitrogen-doped ZnO films belong to the hexagonal crystal structure. The optical properties of the grown samples were examined by optical spectrophotometer and spectroscopic ellipsometer. Transmittance spectra were obtained by spectrophotometer measurements and the effect of nitrogen ratio was investigated. It has been observed that as the nitrogen ratio increases, the transmittance decreases up to ~500 nm and then increases. By using the transmittance curve, the energy band gap was calculated. Further detailed optical analysis was made by the spectroscopic ellipsometry technique. Fitting was performed to ensure the agreement between the experimentally obtained Ψ values and theoretically determined Ψ values using the Cauchy model. As a result, the refractive index was found for each film and it was observed that the refractive index decreased as the nitrogen ratio increased. The scanning electron microscopy (SEM) measurements showed that the surface morphology of the films changes with N doping. Nitrogen was observed in Fourier transform infrared spectra analysis. 5% nitrogendoped ZnO films were grown on the glass substrate using RF magnetron sputtering at room temperature. Samples are prepared by varying thicknesses during the deposition process. XRD and SEM measurements of the samples show the variation in the crystal structure and surface morphology of the film with varying thicknesses. All the samples are tested for the transmittance and band gap. The increase of film thickness increases the grain size. The transmittance is influenced by the film thickness.tr
dc.language.isoengtr
dc.rightsinfo:eu-repo/semantics/closedAccesstr
dc.subject1 . Tanıtımtr
dc.subject2 . deneysel prosedürtr
dc.subject3 . sonuçlar ve tartışmatr
dc.subject4 . Sonuçlartr
dc.titleInvestigation of nitrogen doped ZnO thin films: Effects on their structural and optical propertiestr
dc.typearticletr
dc.contributor.departmentFen Fakültesitr
dc.identifier.volume122tr
dc.identifier.startpage111685tr
dc.relation.publicationcategoryUluslararası Hakemli Dergide Makale - Kurum Öğretim Elemanıtr


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