Determination of Optical Properties of MOVPE-Grown InxGa1-xAs/InP Epitaxial Structures by Spectroscopic Ellipsometry
Citation
Kaynar, E., Sayrac, M., Altuntas, I. et al. Determination of Optical Properties of MOVPE-Grown InxGa1-xAs/InP Epitaxial Structures by Spectroscopic Ellipsometry. Braz J Phys 52, 184 (2022). https://doi.org/10.1007/s13538-022-01187-4Abstract
InxGa1−xAs epitaxial layers with different AsH3
flows have been grown on InP substrate with the MOVPE system. It has
been found that AsH3
flow variation affects the In concentration of InGaAs/InP structure because the increment of AsH3
flow increases the In concentration due to the weak bond between In and As. The variation of AsH3
flow during the growth
process has affected crystal quality and optical properties of InGaAs epilayer. The optical properties of the structure have
been determined by spectroscopic ellipsometry and spectrophotometer. The variation of In concentration has changed the
refractive index value of the structure. The thickness of the samples and refractive index values have been obtained by spectroscopic
ellipsometry. The obtained findings show that the reflection has been improved with high AsH3
flow resulting from
surface quality improvement. In addition, it has been observed that the energy band gap has been decreased as a function
of the increment of AsH3
flow because the structure band gap approaches the InAs structure at the high In concentration.
Source
Brazilian Journal of PhysicsVolume
52Issue
184URI
https://link.springer.com/article/10.1007/s13538-022-01187-4https://hdl.handle.net/20.500.12418/13397