Search
Now showing items 1-2 of 2
Comprehensive growth and characterization study of GeOx/Si
(15.02.2023)
In this study, the reactive radio frequency magnetron sputtering (RFMS) method under varying thickness
was used to deposit GeO x on Si substrate at room temperature. The effect of thickness on the structural
and optical ...
Effect of substrate temperature on Raman study and optical properties of GeOx/ Si thin films
(14.10.2023)
In this study, GeOx
thin films were deposited onto Si substrates using the RF magnetron sputtering method. We looked at
how the temperature of the substrate affected the Raman spectra and optical characteristics of ...