| dc.contributor.author | Tuzemen, Ebru Senadim | |
| dc.contributor.author | Kara, Kamuran | |
| dc.contributor.author | Elagoz, Sezai | |
| dc.contributor.author | Takci, Deniz Kadir | |
| dc.contributor.author | Altuntas, Ismail | |
| dc.contributor.author | Esen, Ramazan | |
| dc.date.accessioned | 2019-07-27T12:10:23Z | |
| dc.date.accessioned | 2019-07-28T09:56:48Z | |
| dc.date.available | 2019-07-27T12:10:23Z | |
| dc.date.available | 2019-07-28T09:56:48Z | |
| dc.date.issued | 2014 | |
| dc.identifier.issn | 0169-4332 | |
| dc.identifier.issn | 1873-5584 | |
| dc.identifier.uri | https://dx.doi.org/10.1016/j.apsusc.2014.02.118 | |
| dc.identifier.uri | https://hdl.handle.net/20.500.12418/8135 | |
| dc.description | 9th Nanoscience and Nanotechnology Conference (NANOTR) -- JUN 24-28, 2013 -- Erzurum, TURKEY | en_US |
| dc.description | WOS: 000344380500030 | en_US |
| dc.description.abstract | ZnO and nitrogen-doped ZnO thin films were prepared onto glass substrate by pulsed filtered cathodic vacuum arc deposition (PFCVAD) system at room temperature. The influence of doping on the structural, electrical and optical properties of thin films was investigated. XRD studies were carried out to analyze and compare the structural quality of undoped and nitrogen-doped ZnO films. Raman measurement was performed to study the doping effects in the ZnO. The optical transmittances of all films are studied as a function of wavelength using UV-VIS-NIR spectrophotometer. The optical band gap values of the films are found using absorbance spectrums. The electrical studies for the films are carried out by using Hall-effect measurements. (C) 2014 Elsevier B.V. All rights reserved. | en_US |
| dc.description.sponsorship | Scientific Research Project Fund of Cumhuriyet University [F-382] | en_US |
| dc.description.sponsorship | This research was supported by Scientific Research Project Fund of Cumhuriyet University under the project number F-382. The Authors thank to Ozge Baglayan from Anadolu University for Raman measurements. | en_US |
| dc.language.iso | eng | en_US |
| dc.publisher | ELSEVIER SCIENCE BV | en_US |
| dc.relation.isversionof | 10.1016/j.apsusc.2014.02.118 | en_US |
| dc.rights | info:eu-repo/semantics/closedAccess | en_US |
| dc.subject | X-ray diffraction | en_US |
| dc.subject | Optical properties | en_US |
| dc.subject | Raman spectroscopy | en_US |
| dc.title | Structural and electrical properties of nitrogen-doped ZnO thin films | en_US |
| dc.type | article | en_US |
| dc.relation.journal | APPLIED SURFACE SCIENCE | en_US |
| dc.contributor.department | [Tuzemen, Ebru Senadim] Cumhuriyet Univ, Dept Phys, Nanotechnol Ctr, TR-58140 Sivas, Turkey -- [Kara, Kamuran] Istanbul Univ, Dept Phys, TR-34314 Istanbul, Turkey -- [Elagoz, Sezai -- Altuntas, Ismail] Cumhuriyet Univ, Dept Nanotechnol Engn, Nanotechnol Ctr, TR-58140 Sivas, Turkey -- [Takci, Deniz Kadir -- Esen, Ramazan] Cukurova Univ, Dept Phys, TR-01330 Adana, Turkey | en_US |
| dc.contributor.authorID | kara, kamuran -- 0000-0002-9598-8108; Kara, Kamuran -- 0000-0002-9598-8108; TAKCI, DENIZ KADIR -- 0000-0002-9841-242X | en_US |
| dc.identifier.volume | 318 | en_US |
| dc.identifier.endpage | 163 | en_US |
| dc.identifier.startpage | 157 | en_US |
| dc.relation.publicationcategory | Makale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı | en_US |
